Electronic Device Charactrerization
IdEM is a user friendly tool for the generation of SPICE ready macromodels of electrical interconnect structures such as packages, connectors, via fi elds, discontinuities up to backplane links and complete power delivery networks. Starting from their input-output port responses, derived from measurement or simulation, IdEM provides accurate, proven, passive and causal broadband computational models that can be used in any circuit simulation environment for reliable transient and AC analyses.
IdEM is an optional part of CST Studio Suite and is also available as a stand-alone offering.
- A proprietary causality check module allows detecting possible measurement/simulation errors that compromise the physical consistency of the raw data;
- Top-class algorithms are available for model passivity enforcement, ensuring safe use of models in systemlevel EMC/SI/PI simulations;
- An advanced module enables multithread capabilities, with an extraordinary speed-up in simulation time and guaranteeing an effi cient macromodeling of everlarger structures;
- All IdEM algorithms are linked to an intuitive Graphical User Interface;
- IdEM is available for Windows and Linux platforms;
- Little expert knowledge is needed for using most algorithms with standard settings. Flexible and powerful – A rich set of control parameters is available for advanced users;
- IdEM uses state-of-the-art fitting algorithms for rational approximations with guaranteed passivity;
- Splitting strategies are adopted for handling large port counts without excessive memory requirements;
- Import fi lters are available for Touchstone and other common data formats;
- Models can be synthesized as equivalent circuits into common SPICE formats.
IdEM uses best-in-class algorithms to build macromodels, including a proprietary data causality certification module based on Hilbert transform, highly scalable rational fitting modules enabling unlimited port counts, and top-class passivity enforcement schemes for safe and stable transient simulations.